Handbook of Microwave Component Measurements

with Advanced VNA Techniques

Nonfiction, Science & Nature, Technology, Microwaves
Cover of the book Handbook of Microwave Component Measurements by Joel P. Dunsmore, Wiley
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Joel P. Dunsmore ISBN: 9781118391259
Publisher: Wiley Publication: August 15, 2012
Imprint: Wiley Language: English
Author: Joel P. Dunsmore
ISBN: 9781118391259
Publisher: Wiley
Publication: August 15, 2012
Imprint: Wiley
Language: English

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers.

The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory.

Key Features:

  • Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
  • Offers a detailed explanation of algorithms and mathematics behind measurements and error correction
  • Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader
  • Written by the principle developer and designer of many of the measurement methods described

This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers.

The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory.

Key Features:

This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

More books from Wiley

Cover of the book Chronic Total Occlusions by Joel P. Dunsmore
Cover of the book Against the Gods by Joel P. Dunsmore
Cover of the book RF Analog Impairments Modeling for Communication Systems Simulation by Joel P. Dunsmore
Cover of the book Pipeline by Joel P. Dunsmore
Cover of the book Day Trade Online by Joel P. Dunsmore
Cover of the book Perl and Apache by Joel P. Dunsmore
Cover of the book Cognitive Behavior Therapies by Joel P. Dunsmore
Cover of the book Physical Assessment for Nurses by Joel P. Dunsmore
Cover of the book Industrial Objectives and Industrial Performance by Joel P. Dunsmore
Cover of the book Reproductive Health Psychology by Joel P. Dunsmore
Cover of the book Essentials of School Neuropsychological Assessment by Joel P. Dunsmore
Cover of the book Spanish For Dummies by Joel P. Dunsmore
Cover of the book Analog and Mixed-Signal Electronics by Joel P. Dunsmore
Cover of the book Objectivity by Joel P. Dunsmore
Cover of the book The Executive and the Elephant by Joel P. Dunsmore
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy