Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms

Nonfiction, Science & Nature, Science, Physics, Spectrum Analysis, Technology, Material Science
Cover of the book Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms by Jozef Veselý, Springer International Publishing
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Jozef Veselý ISBN: 9783319483023
Publisher: Springer International Publishing Publication: November 25, 2016
Imprint: Springer Language: English
Author: Jozef Veselý
ISBN: 9783319483023
Publisher: Springer International Publishing
Publication: November 25, 2016
Imprint: Springer
Language: English

This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.

More books from Springer International Publishing

Cover of the book The Complete Guide to Male Fertility Preservation by Jozef Veselý
Cover of the book Approaches in Bioremediation by Jozef Veselý
Cover of the book Assessing the Economic Impact of Tourism by Jozef Veselý
Cover of the book Local Drivers for Improvement Capacity by Jozef Veselý
Cover of the book Advances in Information Retrieval by Jozef Veselý
Cover of the book Ubiquitous Networking by Jozef Veselý
Cover of the book Atlas of Office Based Andrology Procedures by Jozef Veselý
Cover of the book Augmented Cognition. Enhancing Cognition and Behavior in Complex Human Environments by Jozef Veselý
Cover of the book Industry 4.0: Managing The Digital Transformation by Jozef Veselý
Cover of the book Ambient Assisted Living by Jozef Veselý
Cover of the book Perceptions of Pregnancy from the Seventeenth to the Twentieth Century by Jozef Veselý
Cover of the book Intelligent Control by Jozef Veselý
Cover of the book Youth as Architects of Social Change by Jozef Veselý
Cover of the book E-Learning and Games by Jozef Veselý
Cover of the book Exciton Transport Phenomena in GaAs Coupled Quantum Wells by Jozef Veselý
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy